• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
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    • 专利摘要:
    Device, system and characterization procedure of reflector elements from the light beams reflected therein and in particular from the quality of said light beams. The device comprises at least two variable gain detectors arranged on a common structure, which can be portable or fixed, and arranged to capture the light beams reflected by at least one reflector element, preferably a heliostat, and from at least one processor characterize the quality of said reflected light beams and therefore evaluate the quality of the reflecting element or heliostat from its reflective capacity. Likewise, each detector comprises a lens to increase the signal-to-noise ratio of the reflected beam or beams, at least one light sensor on which the beam or beams captured by the lens are focused, an automatic gain selection system associated with the optical sensor and data communication means associated with the device itself. Also, the invention relates to a system and a method of characterizing reflector elements, heliostats, from the quality of the light beams reflected in at least one reflector element or heliostat. (Machine-translation by Google Translate, not legally binding)
    公开号:ES2738907A1
    申请号:ES201830756
    申请日:2018-07-25
    公开日:2020-01-27
    发明作者:Aguerrea Iñigo Les；Larrayoz Amaia Mutuberria；Lapuente Adrián Peña；González Marcelino Sánchez；Vila Carlos Heras；Ariz Iñigo Salina；Núñez David Izquierdo
    申请人:Fundacion Cener Ciemat；
    IPC主号:
    专利说明:

    [0001] DEVICE, SYSTEM AND PROCEDURE OF CHARACTERIZATION OF ELEMENTS
    [0002]
    [0003] OBJECT OF THE INVENTION
    [0004] The present invention relates to a device for characterizing reflector elements, preferably heliostats, from the light beams reflected therein and in particular from the quality of said light beams. The device comprises at least two variable gain detectors arranged on a common structure, which can be portable or fixed, and arranged to capture the light beams reflected by at least one reflector element or heliostat and from a local processor, or local unit for processing and capturing data, characterizing the quality of said reflected light beams and therefore evaluating the quality of the reflecting element or heliostat from its reflective capacity. Likewise, each detector comprises a lens to increase the signal-to-noise ratio of the reflected beam, an optical sensor in which the beam captured by the lens is focused, an automatic gain selection system associated with the optical sensor and data communication means. associated to the detector itself. Also, the invention relates to a system and a method of characterizing reflector elements, heliostats, from the quality of the light beams reflected in at least one heliostat.
    [0005] The invention is of special application in the concentration of solar energy sector in the characterization of reflector elements or heliostats.
    [0006]
    [0007] DESCRIPTION OF THE STATE OF THE TECHNIQUE
    [0008] Currently the systems of measurement of the quality of the solar beam reflected by the reflector elements, mainly heliostats, in solar tower plants are mainly based on the use of white screens or targets where the beam is projected and the subsequent taking of images of the target illuminated by the beam by optical cameras. In the present invention reference is made to reflecting elements and heliostats interchangeably, so that they should be interpreted in their broadest meaning.
    [0009] Therefore, in the state of the art, heliostat characterization systems are known in solar tower plants based on cameras that perform the image capture of the beam reflected by each heliostat on a target in measurement times short enough for the Sun movement does not affect the measure. However, these systems have limitations that only allow them to measure the beam reflected by heliostats that are close to the tower of the heliostat field and do not allow the characterization of heliostats when any of the following conditions is met: - the beam of heliostats is very large and demands target sizes that are excessively large in size, and
    [0010] - the amount of light reflected by the target is insufficient for measurement because it competes with the ambient light.
    [0011] These limitations are caused by several factors, the distance from the heliostat to the target being the most determining factor, increasing said distance increases the size of the beam by distributing the same amount of light in a larger area by impoverishing the intensity of light reflected by the target and which is captured by the camera. Henceforth, heliostats that meet either of these two limitations and that are not characterizable with prior art methods are referred to as distant heliostats; taking the distance of 800 m as reference distance and approximate current limit of these methods.
    [0012] Mainly for these two reasons the systems known in the state of the art have limitations and do not allow the characterization of heliostats located in fields located in large areas of land.
    [0013] A system for characterizing distant heliostats located more than 800 meters from the tower of the heliostat field is known based on columns of collimated sensors (pages 12 and 13 of http://prod.sandia.gov/techlib/access-control.cgi /2013/135492.pdf). This system uses a rotation of the heliostat motor to sweep the beam over a column of collimated sensors. This system requires the orientation and adjustment of each sensor for each heliostat location, requiring a heliostat rotation motor whose precision and deviation must be well known and controlled, and being limited in dynamic range of measurement for specific distances of the heliostat that is characterizes In addition, this system must perform the measurement in rapid times to avoid errors due to the movement of the sun, competing the rotation of the heliostat with the movement of the sun. However, like the previous system, this is not suitable for the characterization of a heliostat field mainly for two reasons as well:
    [0014] - because in a field of heliostats there are near and far heliostats and its sensor system does not allow to adapt to the different light intensities caused by the different locations of each heliostat quickly, and - because it is not possible to know the possible deviations of each motor of rotation of all heliostats in the field in their step-by-step movement which results in uncontrolled errors in the measure of each heliostat.
    [0015] Therefore, the previous systems are valid in the case of having reflected power above the ambient light and are reliable in the case of heliostats located at distances less than 800 meters, but cease to be reliable when the distance between the Heliostat and the target is greater than 800 meters. In fact, for these distances, greater than 800 meters, the beam size can be up to 30mx30m, so that the optical density projected on the targets and captured by the camera is comparable with the ambient light, making it impossible, or making it very difficult measurement, the measurement of the concentration quality of the heliostat. Similarly, the collimated sensor column technique allows characterization only for distant heliostats (more than 800 m) or only nearby, but not both at the same time for not having adaptable sensors to the incident light.
    [0016] Thus, the systems known in the state of the art have the following drawbacks:
    [0017] - They present errors derived from the fact that the sweep of the heliostats is not always uniform and constant as a result of the precision of the motor,
    [0018] - They present errors as a result of the distance between the heliostat and the tower, where the characterization system is arranged, mainly in those measures of heliostats located far from the tower, and
    [0019] - They present errors derived from the amount or intensity of the light when it competes with the ambient light when it is reflected in heliostats away from the characterization system.
    [0020] Therefore, the present invention proposes a device, a system and a method of characterizing reflector elements, mainly heliostats, which solves the problems existing in the systems of characterization of the state of the art. The device and system objects of the present invention are intended to improve current devices and systems to enable characterization of the quality of the beams reflected by a heliostat for any distance, by:
    [0021] - The use of the movement of the sun to achieve a uniform, constant and error-free scanning of the beam to be characterized by the characterization device object of the present invention,
    [0022] - The adjustment of the dynamic measuring range of the sensors to enable the characterization of heliostats at any distance from the heliostat, and
    [0023] - The inclusion of light capture optics in each sensor to multiply the amount of useful light detected by improving the quality (ratio between useful light and ambient light) of the measurements at any distance from the heliostat; the useful signal being sunlight reflected by the heliostat.
    [0024]
    [0025] DESCRIPTION OF THE INVENTION
    [0026] The present invention has as its object a device for characterizing reflective elements (in the present description the heliostats will be taken as example) from the light beams reflected by them and in particular from the quality of said light beams, as well as a system and a method of characterizing said reflecting elements.
    [0027] The present invention is based on the use of the movement of the sun as a sweeping element of the light beam reflected by the heliostats, which remain immobile, on a structure with at least two sensors, thus ensuring a uniform, constant sweep, without jumps, deviations or errors as happens when a characterization system based on the movement of heliostats is used. Thus, the present invention becomes independent during the measurement characterization of the movements caused by the heliostats rotation motors in the field, and eliminates any type of error, deviation or lack of uniformity in the sweep due to said rotation motors of heliostats or dynamic deformations of the heliostat structure, thus allowing a precise characterization of the reflected beam for each position of the heliostat.
    [0028] Specifically, the present invention has as its first object a characterization device according to claim 1. The device object of the invention uses light capture optics in the detectors to increase the amount of light, coming from the heliostat, in the optical sensor , thus ensuring the correct measurement even in distant heliostats, more than 800 meters from the characterization device, and without the need for a fine pointing adjustment of the detector towards the heliostat. Likewise, the device uses a variable gain amplification system associated with the sensor, to adjust each sensor of the detector or select the appropriate sensor in the detector, in an automated way to the incident radiation, allowing a sufficient dynamic range to ensure the correct characterization of the sensor. full field
    [0029] The device, the first object of the invention, comprises at least two variable gain detectors located on a structure to receive the beam of light reflected by at least one heliostat, where each detector of the device comprises:
    [0030] - a lens to increase the signal-to-noise ratio of the beam,
    [0031] - at least one optical sensor in which the beam captured by the lens is focused,
    [0032] - an automatic gain selection system associated with the optical sensor, with a gain electronics and local processor, or local data processing and capture unit, and
    [0033] - data communication means associated with the detector.
    [0034] For the purposes of the present description, any variable capable of measuring the incident light with the range necessary for the correct measurement is considered variable gain detector.
    [0035] Preferably the lenses of the detectors are of the convergent type, and the optical sensors are silicon photodiodes, although they could also be of inGaAs (indium gallium arsenide), thermopiles, etc.
    [0036] Thus, the detectors of the device incorporate a lens such as focusing optics that on the one hand reduces the opening angle of the detector to reduce the captured ambient light and on the other hand increases the amount of useful light coming from the heliostat, and captured in the detector, towards the sensor In this way, the ratio of useful signal to ambient light of the system is increased by a factor, ratio between sensor area and lens area, between 50 and 100 with respect to state-of-the-art systems based on cameras and collimated sensors. Given the size of the beam to be characterized by a heliostat located more than 800 meters from the characterization device, the detectors will preferably be placed in a vertical matrix on a structure, and the movement of the sun will be used so that the beam itself is reflected by The heliostat, which remains fixed, scans the detector array. The real-time capture of the detector signal will draw the shape of the beam on the horizontal axis, and in the case of beam sizes larger than the detector array, in the vertical dimension, more sweeps will be necessary, with determined displacements of the elevation heliostat to draw the complete beam, these displacements being determined and made while the intensity of the reflected beam is not measured.
    [0037] Also, as mentioned above, the detectors comprise an automatic gain selection system associated with the optical sensor, consisting of a gain electronics associated with the sensor and a local processor, or local data processing and capture unit, to select or adjust the most appropriate gain to the intensity of the light received. The objective of this system is to select or adjust the detector gain, in an automated manner, thanks to the local processor associated with each detector and therefore to each sensor, to the incident radiation reflected by the heliostat. The automatic gain selection system of each detector may comprise a variable gain electronics or a fixed gain electronics or a logarithmic gain electronics. If the detector comprises a single optical sensor, it will be a photodiode or a thermopile, so that the electronic variable gain, of the automatic gain system, will select or adjust in said sensor the most appropriate gain to the light intensity of the received beam by said sensor or detector. On the contrary, if the detector comprises at least two optical sensors, the variable gain electronics, of the automatic gain system, will select between the at least two sensors, that sensor that has the fixed gain most appropriate to the light intensity of the beam received by the sensors, that is, the system's variable gain is determined by the arrangement of at least two fixed gain sensors among which the electronics choose. In the case of logarithmic gain electronics, there will be a variable logarithmic parameter detector (equivalent to the single detector system and variable gain), or at least two detectors with different logarithmic parameters from which the most suitable for the incident light intensity (equivalent to the system of at least two detectors with different gain).
    [0038] For the above purposes, a detector with several independent fixed gain sensors is considered to be equivalent to a sensor with several independent fixed gain photodiodes or thermopiles.
    [0039] To facilitate the calibration and maintenance of the system, the structure, preferably vertical on which the detector array is placed, can be fixed or portable, but preferably it will be foldable, so that it can remain lying on the ground when not carry out activities, and can also be removable. The lifting and lowering tasks of the final system should be monitored, and trying to avoid the need for work at height during the use of the system. The system must incorporate adequate control software, measurement capture and graphic representation interface. Likewise, the array, or matrices, of detectors may be incorporated in the tower of the solar heliostat field or in some other fixed structure (of the own heliostat solar field or independent of it) as a preferred form of application.
    [0040] In addition to the local processor, or a local processing and capture unit, of each detector, responsible for controlling the functions and measurements of each detector, each of these processors will preferably be connected to a global or general processor of the device associated with a means of data communication
    [0041] Also, the detectors can be arranged on the structure following different patterns, either aligned vertically or horizontally or forming a matrix. Said detectors are separated from each other a sufficient distance so that the resolution in the reconstruction of the reflected beam allows a precise analysis and post-processing, for any distance of the heliostat, this separation distance between detectors preferably ranges between 0.5-1 m.
    [0042] The device or detectors installed therein may comprise automatic orientation means, so that either the support structure of the device moves, preferably performing a rotation and changing the orientation of all the detectors at the same time, or each detector is displaces or rotates independently of the structure of the device.
    [0043] With this system a tool will be available for the characterization of the heliostats concentration capacity of solar tower plants at any distance, and in particular for example more than 800 m and preferably more than 1 km, improving the current systems.
    [0044] A second object of the invention is a system for characterizing the quality of heliostats according to claim 11. The system comprises at least one device according to that described above and associated with at least one resting heliostat, that is, a heliostat that is in a fixed or permanent position, with the motion motors switched off or disconnected, that is, motionless, so that the light reflected in the heliostat hits the device and the detectors that make it up with a certain and adequate viewing angle , understood as that angle included in the opening angle of the optical system of each detector.
    [0045] The system devices can have a global processor and calculation means to determine the total image reflected by the heliostat that is generated by scanning the aligned sensors of each device thanks to the movement of the sun. The device or devices that make up the system can be located in different locations in the field of heliostats or solar plant of heliostats. Preferably the at least one device will be located at the top of the tower of the solar heliostat plant or heliostat field to be able to simultaneously characterize as many heliostats as devices are arranged in the tower. Alternatively, the at least one device can be located anywhere, outside the tower, of a heliostat field or solar heliostat plant with the detectors properly oriented, as mentioned above, so as to allow the characterization of said at less a heliostat.
    [0046] Through this system, the total image reflected by the heliostat generated is obtained by scanning the sensors aligned in the structure as a result of the movement of the sun, thus characterizing the quality of the heliostat.
    [0047] A third object of the invention is a process for characterizing the quality of heliostats according to claim 15. The method object of the invention comprises the following steps:
    [0048] - Arranging a device, according to the first object of the invention, in a location of a heliostat field, preferably in a solar tower heliostat plant, with at least two heliostats,
    [0049] - Automatically select the gain of each of the detectors of the device to optimize the noise signal based on the intensity of the beam reflected in at least one heliostat and that is received by each of the detectors, - Capture and measure by the detectors of the device the beam reflected in at least one heliostat that is at rest for a certain period of time, which is approximately 5 min per scan,
    [0050] - Normalize the measurements made by the detectors of the device for the estimation of the radiant energy on the device consisting of discounting the factor of the different gains in each capture, and
    [0051] - Process said measurements and reconstruct the beam reflected by the at least one heliostat
    [0052] As already mentioned, at least one device can be placed in the tower of the solar heliostat plant, preferably at the top, although they can also be placed in other places in the heliostat field as long as the reflected beam reaches the detectors with a angle included in the opening angle thereof and allow the characterization of heliostats or any other reflector element that can be used in solar thermal technology.
    [0053]
    [0054] DESCRIPTION OF THE FIGURES
    [0055] The following figures are attached to the present description showing a preferred embodiment of the invention for illustrative and non-limiting purposes:
    [0056] Figure 1 shows a basic scheme of a system according to the invention with the claimed heliostat characterization device.
    [0057] Figure 2A shows a basic scheme of the movement of the sun and the beam.
    [0058] Figure 2B shows a series of measurements during the movement of the reflected beam and the reconstruction of a reflected beam.
    [0059] Figure 3 shows a diagram of the components of a detector installed in a device object of the invention.
    [0060] Figure 4 shows a block diagram of the gain adjustment procedure executed by the detectors that make up the device object of the invention.
    [0061] Figure 5 shows a basic scheme of an exemplary embodiment of a system object of the invention.
    [0062]
    [0063] PREFERRED FORM OF EMBODIMENT
    [0064] The first figure shows a system according to the present invention in which an array, array or set of detectors 11, preferably up to 25 detectors, of optical power preferably placed equidistant in a device with a vertical structure or column can be observed 10, preferably 15 meters high.
    [0065] The light reflected 40 by the heliostat 30 to be characterized is detected by the detectors 50, to determine the pattern of the beam reflected by it. Using the displacement of the beam 40 itself reflected by the heliostat 30 due to the continuous and known movement of the sun 20 and keeping the heliostat 30 still, the plot of the distribution of the beam reflected 40 by the heliostat 30 is obtained horizontally.
    [0066] In cases where the vertical dimension of the reflected beam 40 is greater than the height of the measuring column of the device, as many traces of the reflected beam 40 are made by the vertical measuring column 10 as necessary. Assuming that two paths are necessary, a first path is made for the measurement of the lower part of the reflected beam 40 and then a second path (after reorienting the heliostat 30 down and leaving it motionless to perform the measurement) for the upper part of the reflected beam 40.
    [0067] The measurements made by each detector 50 are captured and processed in real time (order of milliseconds) by the local processor or local processing and capture unit in each detector 55. The measurements made can be sent to a global processor of the device 12 with a global control, capture and processing unit located, preferably at the foot of column 10.
    [0068] The horizontal scan of the beam over the array of detectors 11 due to the movement of the sun 20 (d-20) is described in basic form in Figure 2A. As the sun 20 performs its movement, the reflected beam 40 by the heliostat 30 travels through the characterization device, and the vertical distribution of the strip of the beam 40 that is projected on the detectors 50 at each moment is obtained (Figure 2B). Since the movement and position of the sun 20 is known, the complete shape of the beam 40 that will be formed by the individual vertical strips measured in the beam path (d-40) by the array of detectors 11 is drawn by proper calculation. The measurement time is determined by the size of the beam 40 and the speed of the sun 20 in its path (approximately 4.4 mrad per minute). For a measuring capacity below the second, the measurement of the beam formed by the set of measured vertical stripes can be considered continuous. In this way, the complete shape of the beam is reconstructed, as shown in Figure 2B, and by means of its analysis the heliostat 30 can be characterized, this means preferably obtaining the focal length thereof and the optical quality of the reflector.
    [0069] The characterization device included in the previous system is formed by detectors 50 that capture the optical power (I) of the beam reflected in the heliostat that falls on them. Each detector 50 is formed by an electronic detection part or automatic gain system 53, an optical detection part 51 and a data communication part 54. A basic scheme of the detector 50, including the local processor or local processing unit and Capture 55 of detector 50, is shown in Figure 3.
    [0070]
    [0071]
    [0072] The detection of each detector is preferably carried out by means of an optical sensor 52 disposed in each detector 50. Said optical sensors 52 are preferably large-area silicon photodiodes, although they can be another type of sensors that allow the gain to be adjusted, such as for example thermopiles. The sensing electronics or automatic gain system 53 measures the continuous signal captured by the optical sensor 52, and includes a digital gain potentiometer that allows the gain level (G) of each detector 50 to be adjusted to the received power level for each detector 50 at each moment. This is because the power densities of the beam will vary strongly between the center zone of the beam and the area of the ends (see figure 2). The adjustment of the gain (G) of each detector 50 to that of the received signal will determine the final measurement time of each vertical strip. It is foreseeable that, since the changes in power density will be slow, of the order of seconds, the gain adjustment algorithm will allow the optimization of the signals of all the detectors in a time below the second, so that measurement will be taken of each vertical strip of the beam at times of the order of the second. A basic scheme of the measurement procedure of each detector including automatic gain adjustment is reflected in Figure 4.
    [0073] Said automatic gain selection method comprises upon detection of the intensity (I) of the light beam by the optical sensor 52 its conversion to electric current (C) for the measurement of the gain in the automatic gain system 53 whose electrical signal (S) is transmitted to processor 55 of detector 50. If said signal (S) is greater than a pre-established maximum threshold (Umax) an order to decrease the gain (G) is sent to the gain system 53, and if said signal (S) is less than a pre-established minimum threshold (Umin) an order to increase the gain (G) is sent to the automatic gain system 53. Once the gain (G) is adjusted the electrical signal ( S) is saved (Ss).
    [0074] In the previous embodiment, the automatic gain selection system 53 of each detector 50 with a single optical sensor 52, preferably a photodiode or a thermopile, has a variable gain electronics that selects or adjusts on said sensor 52 the most suitable gain to the light intensity (I) of the beam received by said sensor 52 or detector 50.
    [0075] In an alternative embodiment of a detector with an automatic variable gain system, the detector comprises several sensors, at least two, each being associated with a fixed gain, so that the dynamic range of measurement required for different sensors is covered between the correct characterization of heliostats. In this case, the automatic gain system selects between the at least two sensors, that sensor that has the fixed gain most appropriate to the light intensity of the beam received by the sensors, that is to say, the variable gain of the system is determined by the arrangement of at least two fixed gain sensors among which the electronics choose the most suitable one, allowing it to adapt to different circumstances.
    [0076] The other time of interest is the capture of the signals of all the detectors 50, which in any situation will be of the order of milliseconds. That is, once all the detectors 50 have selected or adjusted their gains (below the second), the capture and measurement of the signals of each detector 50 will be made in the time of milliseconds.
    [0077] The optical part of the detector 51 makes it possible to reduce the opening angle of the measurement to reduce the background level due to diffused light and at the same time multiply the detected optical power factor to increase the level of detected useful signal. In this way, the signal / background ratio is multiplied by a factor of 50-100 with respect to a direct detection, for example of a camera signal capture system. Thus, the characterization of heliostats 30 located over large distances, beyond 800 m, is ensured.
    [0078] Finally, the data communication electronics 54 allows the signals measured by each detector 50 to be acquired and sent to the global processor or global capture and processing unit of the device 12, preferably located in the device although it may be located away from it, which is the one in charge of normalizing said measures for the estimation of the radiant energy on the device or devices, to later process the measurements and reconstruct the beam reflected by each heliostat.
    [0079] As mentioned, the set 11 of detectors 50 will report the measured signals to the overall processor of the device 12 preferably arranged in the structure of the device 10. This overall processor of the device 12, since it must work outside, will be adequately conditioned to such effect. As mentioned, the acquired signals can also be sent to a central data processing system, which will preferably be a computer located in an area of greater comfort. The data will be processed by a suitable signal processing software and by means of the same or other suitable software, the shape of the spatial distribution of the characterized beam will be represented graphically, with the interface functions necessary for its capture, saving and edition.
    [0080] The detector column 11 will preferably have a mechanical fastening system 10 preferably based on aluminum profiles that allows the same height as the detector distribution to be reached, for example 15 m. This distance corresponds to the approximate diameter of the beam reflected by a heliostat 800 m away, for greater distances the beam will gradually increase, forcing as many passes as necessary. Obviously, the beam size 40 as a function of the distance is approximate and depends on the optical quality of heliostat 30. In this system, the detection elements 50 and the power and communication wiring thereof will be placed equally spaced. The mechanical system 10 that is initially proposed will allow the measuring column 11 to be lowered or lifted. In this way, at the moments or days of activity the measurement column 11 will be vertical and elevated, secured by means of conveniently anchored to the ground to support the actions of the wind. And in the moments or days of no test, the measuring column 11 will be folded on the ground being horizontal on it and covered, for example by a tarp, to avoid its degradation or fouling. Thus, the assembly of column 10, its set-up and maintenance or cleaning work can be done comfortably working from the ground, without the need for work at height. It will also allow the system calibration process to be performed more easily. The lifting and collapsing actions of the measuring column 11 would be carried out by means of the use of a motor with traction suitable for the weight and torque of the structure 10. The assembly form of the vertical column and the associated column wiring It will be in such a way that it can be disassembled into several sections of suitable length for transfer and assembly to other locations. With the device 11 collapsed on the ground, a suitable optical system will allow a calibration process of the detector assembly 50 that is simple to perform.
    [0081] Alternatively, Figure 5 describes the preferred application of the device object of the invention located in tower 31 of a solar tower plant. Thus, several devices 11, 11 'coexist and characterize heliostats 30, 30' simultaneously through reflected beams 40, 40 'in the same manner as previously described. The benefits granted by the optical device of the detectors 50 allow the beams of heliostats 30, 30 'pointing to adjacent systems have no influence on each other.
    [0082] According to the systems described above, the procedure for characterizing the quality of the beam reflected by a heliostat comprises the following steps:
    [0083] - Provision of a characterization device as described above,
    [0084] - Positioning of the reflected beam adjacent to the device and on the side and position that favors the scanning of the device as a result of the movement of the sun, - Automatic and continuous selection of the gain of each of the detectors of the device for the optimization of the signal of noise depending on the intensity of the light beam reflected by the heliostat and received by each of said detectors,
    [0085]
    [0086]
    [0087] - Collection by the device of discrete measurements of the light reflected by the heliostat, which is at rest, for a certain period of time while the beam sweeps the device, in all the necessary sweeps,
    [0088] - Standardization of the measurements of the detectors of the device for the estimation of the radiant energy on the device, and
    [0089] - Processing of the measurements carried out and reconstruction of the reflected beam obtaining the complete form of the same whose analysis and post-processing characterizes the heliostat, preferably its focal length and optical quality.
    权利要求:
    Claims (15)
    [1]
    1. Device for characterizing reflector elements through the light beams reflected by them characterized in that it comprises at least two variable gain detectors located on a structure to receive the beam of light reflected by at least one reflector element, so that each detector comprises:
    - a lens to increase the signal-to-noise ratio of the beam,
    - at least one optical sensor in which the beam captured by the lens is focused,
    - an automatic gain selection system, associated with the optical sensor, with a data processing and capture unit, and
    - data communication means associated with the detector.
    [2]
    2. Device according to claim 1, characterized in that the structure comprises the aligned detectors forming a matrix.
    [3]
    3. Device according to claim 1, characterized in that the structure comprises the vertically aligned detectors.
    [4]
    4. Device according to claim 1, characterized in that the structure comprises the horizontally aligned detectors.
    [5]
    5. Device according to claim 1, characterized in that the automatic gain adjustment system comprises a variable gain electronics for selecting the gain of a sensor more suited to the light intensity of the beam received by said sensor.
    [6]
    Device according to claim 1, characterized in that the automatic gain adjustment system comprises a fixed gain electronics for selecting a sensor, from at least two sensors, with the gain most appropriate to the light intensity of the beam received by the sensors
    [7]
    7. Device according to claim 1, characterized in that the automatic gain adjustment system comprises a logarithmic gain electronics.
    [8]
    Device according to claim 5, characterized in that the optical sensor is a silicon photodiode and / or a thermopile.
    [9]
    Device according to claim 6, characterized in that the optical sensors are at least two photodiodes and / or at least two thermopiles and / or at least one photodiode and at least one thermopile.
    [10]
    10. Device according to claim 1, characterized in that it comprises an automatic detector orientation system.
    [11]
    11. Quality characterization system of light beams reflected by reflector elements characterized in that it comprises:
    - At least one device according to claims 1 to 10, and
    - At least one motionless reflector element whose reflected light falls on the detectors of the device with a certain viewing angle.
    [12]
    12. System, according to claim 11, characterized in that it comprises a processor and calculation means for determining the total image reflected by the reflector element that is generated by scanning the aligned sensors of the device thanks to the movement of the sun.
    [13]
    13. System, according to claims 11 to 12, characterized in that said at least one device is located on top of a tower of a solar plant of reflecting elements to simultaneously characterize as many reflecting elements as devices are arranged in the tower.
    [14]
    14. System according to claims 11 to 13, characterized in that said at least one device is located anywhere in a field of reflector elements with the detectors aligned with at least one reflector element so that the viewing angle allows the characterization of said At least one reflector element.
    [15]
    15. Procedure for characterizing the quality of the light beams reflected by reflector elements, characterized in that it comprises the following stages:
    - Arranging a device according to claims 1 to 10 in a field of reflecting elements comprising at least two reflecting elements,
    - Select the gain of each of the detectors of the device for the optimization of the noise signal based on the intensity of the light beam reflected by a reflector element and received by each of said detectors,
    - Capture and measure by the detectors of the device the light reflected by the reflector element, which is at rest, for a certain period of time, - Normalize the measurements made by the detectors of the device for the estimation of the radiant energy on the device , Y
    - Process said measurements and reconstruct the beam reflected by the at least one reflector element.
    one
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    同族专利:
    公开号 | 公开日
    US20210318033A1|2021-10-14|
    EP3828481A1|2021-06-02|
    IL280394D0|2021-03-01|
    AU2019309185A1|2021-03-04|
    CL2021000183A1|2021-08-06|
    WO2020021147A1|2020-01-30|
    ES2738907B2|2020-12-30|
    ES2738907A8|2020-07-07|
    CN112469947A|2021-03-09|
    引用文献:
    公开号 | 申请日 | 公开日 | 申请人 | 专利标题
    US4219729A|1978-06-16|1980-08-26|Smith Otto J M|Method of aligning and locating the mirrors of a collector field with respect to a receptor tower|
    US20080295883A1|2007-05-30|2008-12-04|Varisolar Inc.|Adaptive solar concentrator system|
    US20100139644A1|2008-10-29|2010-06-10|Brightsource Industries , Ltd.|Heliostat calibration|
    US8664577B1|2011-09-21|2014-03-04|Sandia Corporation|Long range heliostat target using array of normal incidence pyranometers to evaluate a beam of solar radiation|
    WO2013044848A1|2011-09-29|2013-04-04|Sun Haixiang|Calibration system and calibration method for heliostat in solar power station|
    ES2579208A1|2015-01-05|2016-08-08|Abengoa Solar New Technologies, S.A.|System and method of detection of incident radiation on a solar receiver |
    CN103309359B|2012-03-14|2018-11-09|亮源工业（以色列）有限公司|Method and system for operating solar column system|
    WO2015117192A1|2014-02-06|2015-08-13|Commonwealth Scientific And Industrial Research Organisation|Monitoring and measuring of multiple light sources especially heliostats|
    法律状态:
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    ES201830756A|ES2738907B2|2018-07-25|2018-07-25|PROCEDURE FOR CHARACTERIZING REFLECTIVE ELEMENTS FROM THE BEAMS OF LIGHT REFLECTED THROUGH THEM|ES201830756A| ES2738907B2|2018-07-25|2018-07-25|PROCEDURE FOR CHARACTERIZING REFLECTIVE ELEMENTS FROM THE BEAMS OF LIGHT REFLECTED THROUGH THEM|
    AU2019309185A| AU2019309185A1|2018-07-25|2019-07-25|Device, system and method of characterizing reflective elements through reflected light beams|
    US17/262,330| US20210318033A1|2018-07-25|2019-07-25|Characterization device, system and method for characterizing reflective elements from the light beams reflected therein|
    CN201980049357.XA| CN112469947A|2018-07-25|2019-07-25|Apparatus, system and method for characterizing a reflective element by reflecting a beam|
    PCT/ES2019/070524| WO2020021147A1|2018-07-25|2019-07-25|Device, system and method of characterizing reflective elements through reflected light beams|
    EP19773882.6A| EP3828481A1|2018-07-25|2019-07-25|Device, system and method of characterizing reflective elements through reflected light beams|
    CL2021000183A| CL2021000183A1|2018-07-25|2021-01-22|Device, system and procedure for characterization of reflective elements from the light beams reflected in them|
    IL280394A| IL280394D0|2018-07-25|2021-01-25|Device, system and method of characterizing reflective elements through reflected light beams|
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